• Русский
  • English (UK)
  • About
  • Issues
  • F. Y. I.
  • Authors
  • Contacts
  • Editor in chief column

Journal columns

  • Economics of Innovation-Driven Growth: Theory and Practice
  • Philosophy: Universe in Man and Man in Universe
  • Pedagogical Reference System: Education, Upbringing, Personal Growth
  • Personality. Society. State.
  • Brief Reports
  • Information
  • Organizational and Economic Aspects of Innovative Activity (2014—2016)
  • Financial and Economic Activity's Corporate Management (2014—2016)
  • Marketing and International Business (2014—2016)
  • Spiritual and Moral Problems of Existence (2014—2016)
  • Problems of Social Development and Education (2014—2016)

Conference Proceedings

  • Towards the 50th Anniversary of National Research University of Electronic Technology
  • Descartes' Rationalism and Modern Science: Research and Practice Conference Proceedings
  • The Rational and the Irrational in Life, Philosophy and Science: Research and Practice Conference Proceedings
  • 70th Anniversary of the Great Victory
  • Practice of Electronic Components Use in Class Assignments for Students: Lecturers’ Education and Methodics Conference Abstracts
  • Rationalism and Culture Universals: International Research and Practice Conference Abstracts

Using the Singular Value Decomposition of Matrix for Electron Microscopic Images Compression

Written by N. A. Bogdanova, Yu. S. Zybina, E. S. Shpakova

The authors have considered the algorithm of scanning electron microscopic images compression using a singular value decomposition of matrix (SVD). They did show that clipping insignificant component makes it possible to significantly reduce the dimension of problem without losing image quality. The authors carried out the analysis of the data for various micrographs and drew a conclusion that the efficiency of the algorithm was much higher if a larger area was occupied by the image elements with the same contrast.

Keywords: scanning electron microscopy; digital signal and image processing; singular value decomposition; matrix; principal component analysis.

References

  1. Rastrovaya elektronnaya mikroskopiya dlya nanotekhnologii. Metody i primeneniya (Scanning Microscopy for Nanotechnology: Techniques and Applications), Red. U. Zhu, L. U. Zhoang, per. s angl. S. A. Ivanova, K. I. Domkina, M., Binom. Laboratoriya znanii, 2013, 582 p.
  2. Voevodin V. V., Voevodin Vl. V. Entsiklopediya lineinoi algebry: elektronnaya sistema LINEAL (Linear Algebra Encyclopedy: LINEAL Electronic System), SPb, BKhV-Peterburg, 2006, 543 p., 1 CD-ROM.
When quoting a reference to the journal is obligatory. Reproduction of these materials in print, electronic or other publications without permission of the publisher is prohibited. Material published in the Journal is intended for noncommercial use only.
© 2024 All rights reserved